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org in February 2000
Performance-Based Equipment Training (PBET) improves the likelihood that the workforce of semiconductor equipment owners can successfully install
It is a test method
manufacturing control
M07400 - SEMI M74 - 直径450mmメカニカルハンドリング鏡面ウェーハの仕様 StdPbc-0513 org in February 2000global Silicon Wafer Committee2008829global Audits and Reviews Subcommittee200810www. semi. org200811CD ROM 450mmAMHS450mm450mm 450mm 5 SISystem International Referenced SEMI Standards SEMI M1 Specifications for Polished Monocrystalline Silicon Wafers SEMI M20 Practice for Establishing a Wafer Coordinate System SEMI M59 Terminology for Silicon Technology SEMI MF533 Test Method for Thickness and Thickness Variation of Silicon Wafers SEMI MF928 Test